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    TEM in situ study of isothermally induced cracking in the near-interface region of a SiCw/6061Al composite

    New search for: Liu, J.
    New search for: Wang, D. Z.
    New search for: Yao, C. K.

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    TEM in situ study of isothermally induced cracking in the near-interface region of a SiCw/6061Al composite

    New search for: Liu, J.
    New search for: Wang, D. Z.
    New search for: Yao, C. K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    TEM in situ study of isothermally induced cracking in the near-interface region of a SiCw/6061Al composite

    New search for: Liu, J.
    New search for: Wang, D. Z.
    New search for: Yao, C. K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    TEM in situ study of isothermally induced cracking in the near-interface region of a SiCw/6061Al composite

    Contributors:

    Liu, J. (author) / Wang, D. Z. (author) / Yao, C. K. (author)

    Published in:

    JOURNAL OF MATERIALS SCIENCE LETTERS ; 14 ; 201

    Publication date:

    1995-01-01

    Size:

    201 pages

    ISSN:

    0261-8028

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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