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    Experimental Determination of the Specific Positron Trapping Rates in Semiconductors

    New search for: Krause-Rehberg, R.
    New search for: Polity, A.
    New search for: Abgarjan, T.
    New search for: He, Y.-J.
    New search for: Cao, B.-S.
    New search for: Jean, Y. C.

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    Experimental Determination of the Specific Positron Trapping Rates in Semiconductors

    New search for: Krause-Rehberg, R.
    New search for: Polity, A.
    New search for: Abgarjan, T.
    New search for: He, Y.-J.
    New search for: Cao, B.-S.
    New search for: Jean, Y. C.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Experimental Determination of the Specific Positron Trapping Rates in Semiconductors

    New search for: Krause-Rehberg, R.
    New search for: Polity, A.
    New search for: Abgarjan, T.
    New search for: He, Y.-J.
    New search for: Cao, B.-S.
    New search for: Jean, Y. C.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Experimental Determination of the Specific Positron Trapping Rates in Semiconductors

    Contributors:

    Krause-Rehberg, R. (author) / Polity, A. (author) / Abgarjan, T. (author) / He, Y.-J. / Cao, B.-S. / Jean, Y. C.

    Published in:

    Positron Annihilation ICPA-10 ; 427

    MATERIALS SCIENCE FORUM

    Publication date:

    1995-01-01

    Size:

    427 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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