The Use of Low Energy Positron to Probe Defects in Langmuir-Blodgett Films: Fid-Bau Portal

The Use of Low Energy Positron to Probe Defects in Langmuir-Blodgett Films

Smith, F. A. / Naidu, S. V. / Hill, M. A. / Tucker, C.

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The Use of Low Energy Positron to Probe Defects in Langmuir-Blodgett Films

Smith, F. A. / Naidu, S. V. / Hill, M. A. / Tucker, C.

The Use of Low Energy Positron to Probe Defects in Langmuir-Blodgett Films

Smith, F. A. / Naidu, S. V. / Hill, M. A. / Tucker, C.

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Order at Subito €

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Document information

Title:

The Use of Low Energy Positron to Probe Defects in Langmuir-Blodgett Films

Contributors:

Smith, F. A. (author) / Naidu, S. V. (author) / Hill, M. A. (author) / Tucker, C. (author) / He, Y.-J. / Cao, B.-S. / Jean, Y. C.

Published in:

Positron Annihilation ICPA-10 ; 533

MATERIALS SCIENCE FORUM

Publication date:

1995-01-01

Size:

533 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 620.11

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