TEM studies of damage induced in SiC-SiC composites irradiated with swift Xe ions: Fid-Bau Portal

TEM studies of damage induced in SiC-SiC composites irradiated with swift Xe ions

Sebire-Lhermitte, I. / Vicens, J. / Chermant, J. L. / Levalois, M.

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TEM studies of damage induced in SiC-SiC composites irradiated with swift Xe ions

Sebire-Lhermitte, I. / Vicens, J. / Chermant, J. L. / Levalois, M.

TEM studies of damage induced in SiC-SiC composites irradiated with swift Xe ions

Sebire-Lhermitte, I. / Vicens, J. / Chermant, J. L. / Levalois, M.

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Document information

Title:

TEM studies of damage induced in SiC-SiC composites irradiated with swift Xe ions

Contributors:

Sebire-Lhermitte, I. (author) / Vicens, J. (author) / Chermant, J. L. (author) / Levalois, M. (author)

Published in:

JOURNAL OF MATERIALS SCIENCE ; 30 ; 2115

Publication date:

1995-01-01

Size:

2115 pages

ISSN:

0022-2461

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 620.11

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