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Identification of oxidation mechanisms in silicon nitride ceramics by transmission electron microscopy studies of oxide scales

Backhaus-Ricoult, M. / Gogotsi, Y. G.

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Identification of oxidation mechanisms in silicon nitride ceramics by transmission electron microscopy studies of oxide scales

Backhaus-Ricoult, M. / Gogotsi, Y. G.

Identification of oxidation mechanisms in silicon nitride ceramics by transmission electron microscopy studies of oxide scales

Backhaus-Ricoult, M. / Gogotsi, Y. G.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Identification of oxidation mechanisms in silicon nitride ceramics by transmission electron microscopy studies of oxide scales

Contributors:

Backhaus-Ricoult, M. (author) / Gogotsi, Y. G. (author)

Published in:

JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 10 ; 2306

Publication date:

1995-01-01

Size:

2306 pages

ISSN:

0884-2914

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 620.11

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