X-ray characterization of InGaAs/AlAs multiple quantum well p-i-n structures: Fid-Bau Portal

X-ray characterization of InGaAs/AlAs multiple quantum well p-i-n structures

Hart, L. / Ghisoni, M. / Stavrinou, P. / Roberts, C.

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X-ray characterization of InGaAs/AlAs multiple quantum well p-i-n structures

Hart, L. / Ghisoni, M. / Stavrinou, P. / Roberts, C.

X-ray characterization of InGaAs/AlAs multiple quantum well p-i-n structures

Hart, L. / Ghisoni, M. / Stavrinou, P. / Roberts, C.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

X-ray characterization of InGaAs/AlAs multiple quantum well p-i-n structures

Contributors:

Hart, L. (author) / Ghisoni, M. (author) / Stavrinou, P. (author) / Roberts, C. (author)

Published in:

MATERIALS SCIENCE AND TECHNOLOGY -LONDON- ; 11 ; 50

Publication date:

1995-01-01

Size:

50 pages

ISSN:

0267-0836

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 620.11

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