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The Debye temperature of nanocrystalline -Sn measured by x-ray diffraction

Hong, L. B. / Ahn, C. C. / Fultz, B.

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The Debye temperature of nanocrystalline -Sn measured by x-ray diffraction

Hong, L. B. / Ahn, C. C. / Fultz, B.

The Debye temperature of nanocrystalline -Sn measured by x-ray diffraction

Hong, L. B. / Ahn, C. C. / Fultz, B.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

The Debye temperature of nanocrystalline -Sn measured by x-ray diffraction

Contributors:

Hong, L. B. (author) / Ahn, C. C. (author) / Fultz, B. (author)

Published in:

JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 10 ; 2408

Publication date:

1995-01-01

Size:

2408 pages

ISSN:

0884-2914

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 620.11

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