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    Characterization of Complex Silver Halide Photographic Systems by Means of Analytical Electron Microscopy

    New search for: Oleshko, V.
    New search for: Gijbels, R.

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    Characterization of Complex Silver Halide Photographic Systems by Means of Analytical Electron Microscopy

    New search for: Oleshko, V.
    New search for: Gijbels, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterization of Complex Silver Halide Photographic Systems by Means of Analytical Electron Microscopy

    New search for: Oleshko, V.
    New search for: Gijbels, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
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    Document information
    Title:

    Characterization of Complex Silver Halide Photographic Systems by Means of Analytical Electron Microscopy

    Contributors:

    Oleshko, V. (author) / Gijbels, R. (author)

    Published in:

    MICROBEAM ANALYSIS -DEERFIELD BEACH- ; 4 ; 1-30

    Publication date:

    1995-01-01

    Size:

    30 pages

    ISSN:

    1061-3420

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  544

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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