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    Erbium in Silicon: A Defect System for Optoelectronic Integrated Circuits

    New search for: Michel, J.
    New search for: Palm, J.
    New search for: Gan, F.
    New search for: Ren, F. Y. G.
    New search for: Zheng, B.
    New search for: Dunham, S. T.
    New search for: Kimerling, L. C.

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    Erbium in Silicon: A Defect System for Optoelectronic Integrated Circuits

    New search for: Michel, J.
    New search for: Palm, J.
    New search for: Gan, F.
    New search for: Ren, F. Y. G.
    New search for: Zheng, B.
    New search for: Dunham, S. T.
    New search for: Kimerling, L. C.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Erbium in Silicon: A Defect System for Optoelectronic Integrated Circuits

    New search for: Michel, J.
    New search for: Palm, J.
    New search for: Gan, F.
    New search for: Ren, F. Y. G.
    New search for: Zheng, B.
    New search for: Dunham, S. T.
    New search for: Kimerling, L. C.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Erbium in Silicon: A Defect System for Optoelectronic Integrated Circuits

    Contributors:

    Michel, J. (author) / Palm, J. (author) / Gan, F. (author) / Ren, F. Y. G. (author) / Zheng, B. (author) / Dunham, S. T. (author) / Kimerling, L. C. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 585-590

    Publication date:

    1995-01-01

    Size:

    6 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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