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Photoluminescence Defect Diagnostics in Poly-Si Thin Films

Ostapenko, S. S. / Savchuk, A. U. / Nowak, G. / Lagowski, J. / Jastrzebski, L.

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Photoluminescence Defect Diagnostics in Poly-Si Thin Films

Ostapenko, S. S. / Savchuk, A. U. / Nowak, G. / Lagowski, J. / Jastrzebski, L.

Photoluminescence Defect Diagnostics in Poly-Si Thin Films

Ostapenko, S. S. / Savchuk, A. U. / Nowak, G. / Lagowski, J. / Jastrzebski, L.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Photoluminescence Defect Diagnostics in Poly-Si Thin Films

Contributors:

Ostapenko, S. S. (author) / Savchuk, A. U. (author) / Nowak, G. (author) / Lagowski, J. (author) / Jastrzebski, L. (author)

Published in:

MATERIALS SCIENCE FORUM ; 1897-1902

Publication date:

1995-01-01

Size:

6 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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