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Techniques for Depth-Selective, Low-Frequency Eddy Current Analysis for SQUID-Based Nondestructive Testing
Techniques for Depth-Selective, Low-Frequency Eddy Current Analysis for SQUID-Based Nondestructive Testing
Techniques for Depth-Selective, Low-Frequency Eddy Current Analysis for SQUID-Based Nondestructive Testing
Yu Pei Ma (author) / Wikswo, J. P. (author)
JOURNAL OF NONDESTRUCTIVE EVALUATION ; 14 ; 149-167
1995-01-01
19 pages
Article (Journal)
English
DDC:
621.1127
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