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    Characterization of ultrasharp field emitters by projection microscopy

    New search for: Fransen, M. J.
    New search for: Damen, E. P. N.
    New search for: Schiller, C.
    New search for: Van Rooy, T. L.
    New search for: Groen, H. B.
    New search for: Kruit, P.

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    Characterization of ultrasharp field emitters by projection microscopy

    New search for: Fransen, M. J.
    New search for: Damen, E. P. N.
    New search for: Schiller, C.
    New search for: Van Rooy, T. L.
    New search for: Groen, H. B.
    New search for: Kruit, P.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterization of ultrasharp field emitters by projection microscopy

    New search for: Fransen, M. J.
    New search for: Damen, E. P. N.
    New search for: Schiller, C.
    New search for: Van Rooy, T. L.
    New search for: Groen, H. B.
    New search for: Kruit, P.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Characterization of ultrasharp field emitters by projection microscopy

    Contributors:

    Fransen, M. J. (author) / Damen, E. P. N. (author) / Schiller, C. (author) / Van Rooy, T. L. (author) / Groen, H. B. (author) / Kruit, P. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 94/95 ; 107-112

    Publication date:

    1996-01-01

    Size:

    6 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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