Secondary ion emission from Langmuir-Blodgett (LB) films investigated by time-of-flight secondary ion mass spectrometry

Kudo, M. / Yamada, S. / Yoshida, S. et al. | British Library Online Contents | 1996

A quantitative time-of-flight secondary ion mass spectrometry study of ion formation mechanisms using acid-base alternating Langmuir-Blodgett films

Li, J.-X. / Gardella, J. A. / McKeown, P. J. | British Library Online Contents | 1995

Thickness and energy dependence of secondary ion emissions from Langmuir-Blodgett films

Hoshi, T. / Yoshida, S. / Watanabe, T. et al. | British Library Online Contents | 1999

Novel Photorecording Langmuir-Blodgett Films

Liu, M. / Ushida, K. / Nakahara, H. et al. | British Library Online Contents | 1997

Concentration of N and P in SiC Investigated by Time-Of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

Acarturk, T. / Semmelroth, K. / Pensl, G. et al. | British Library Online Contents | 2005