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    In Situ Atomic Resolution Electron Microscopy of Metal-Mediated Crystallization of Semiconductors

    New search for: Konno, T. J.
    New search for: Sinclair, R.

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    In Situ Atomic Resolution Electron Microscopy of Metal-Mediated Crystallization of Semiconductors

    New search for: Konno, T. J.
    New search for: Sinclair, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    In Situ Atomic Resolution Electron Microscopy of Metal-Mediated Crystallization of Semiconductors

    New search for: Konno, T. J.
    New search for: Sinclair, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Title:

    In Situ Atomic Resolution Electron Microscopy of Metal-Mediated Crystallization of Semiconductors

    Contributors:

    Konno, T. J. (author) / Sinclair, R. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 749-754

    Publication date:

    1996-01-01

    Size:

    6 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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