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Infrared external reflection spectroscopy of self-assembled monolayer films on Si substrate with a buried metal layer (BML) structure
Infrared external reflection spectroscopy of self-assembled monolayer films on Si substrate with a buried metal layer (BML) structure
Infrared external reflection spectroscopy of self-assembled monolayer films on Si substrate with a buried metal layer (BML) structure
Kobayashi, Y. (author) / Ogino, T. (author) / Feldman, L. C. / Nishizawa, J. / Van der Weg, W. F.
1996-01-01
5 pages
Article (Journal)
English
DDC:
621.35
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