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SiC/SiC Interface Characterisation using Nanoindentation Techniques

Elizalde, M. R. / Daniel, A. M. / Martinez-Esnaola, J. M.

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SiC/SiC Interface Characterisation using Nanoindentation Techniques

Elizalde, M. R. / Daniel, A. M. / Martinez-Esnaola, J. M.

SiC/SiC Interface Characterisation using Nanoindentation Techniques

Elizalde, M. R. / Daniel, A. M. / Martinez-Esnaola, J. M.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

SiC/SiC Interface Characterisation using Nanoindentation Techniques

Contributors:

Elizalde, M. R. (author) / Daniel, A. M. (author) / Martinez-Esnaola, J. M. (author)

Published in:

KEY ENGINEERING MATERIALS ; 609-616

Publication date:

1997-01-01

Size:

8 pages

ISSN:

1013-9826

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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