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    Study of copper aggregations at dislocations in GaAs

    New search for: Leipner, H. S.
    New search for: Scholz, R.
    New search for: Syrowatka, F.
    New search for: Uniewski, H.
    New search for: Schreiber, J.
    New search for: Balkanski, M.
    New search for: Kamimura, H.
    New search for: Mahajan, S.

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    Study of copper aggregations at dislocations in GaAs

    New search for: Leipner, H. S.
    New search for: Scholz, R.
    New search for: Syrowatka, F.
    New search for: Uniewski, H.
    New search for: Schreiber, J.
    New search for: Balkanski, M.
    New search for: Kamimura, H.
    New search for: Mahajan, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Study of copper aggregations at dislocations in GaAs

    New search for: Leipner, H. S.
    New search for: Scholz, R.
    New search for: Syrowatka, F.
    New search for: Uniewski, H.
    New search for: Schreiber, J.
    New search for: Balkanski, M.
    New search for: Kamimura, H.
    New search for: Mahajan, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Study of copper aggregations at dislocations in GaAs

    Contributors:

    Leipner, H. S. (author) / Scholz, R. (author) / Syrowatka, F. (author) / Uniewski, H. (author) / Schreiber, J. (author) / Balkanski, M. / Kamimura, H. / Mahajan, S.

    Published in:

    Solid-State Materials for Advanced Technology ; 185-188

    MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 42

    Publication date:

    1996-01-01

    Size:

    4 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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