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    Quantitative characterization of fracture surface roughness using secondary electron line scanning method

    New search for: Li, X.
    New search for: Tian, J.
    New search for: Kang, Y.
    New search for: Su, H.
    New search for: Wang, Z.

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    Quantitative characterization of fracture surface roughness using secondary electron line scanning method

    New search for: Li, X.
    New search for: Tian, J.
    New search for: Kang, Y.
    New search for: Su, H.
    New search for: Wang, Z.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Quantitative characterization of fracture surface roughness using secondary electron line scanning method

    New search for: Li, X.
    New search for: Tian, J.
    New search for: Kang, Y.
    New search for: Su, H.
    New search for: Wang, Z.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Quantitative characterization of fracture surface roughness using secondary electron line scanning method

    Contributors:

    Li, X. (author) / Tian, J. (author) / Kang, Y. (author) / Su, H. (author) / Wang, Z. (author)

    Published in:

    JOURNAL OF MATERIALS SCIENCE LETTERS ; 15 ; 2137-2140

    Publication date:

    1996-01-01

    Size:

    4 pages

    ISSN:

    0261-8028

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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