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    Laser damage of alkaline-earth fluorides at 248 nm and the influence of polishing grades

    New search for: Stenzel, E.
    New search for: Gogoll, S.
    New search for: Sils, J.
    New search for: Huisinga, M.
    New search for: Johansen, H.
    New search for: Kaestner, G.
    New search for: Reichling, M.
    New search for: Matthias, E.

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    Laser damage of alkaline-earth fluorides at 248 nm and the influence of polishing grades

    New search for: Stenzel, E.
    New search for: Gogoll, S.
    New search for: Sils, J.
    New search for: Huisinga, M.
    New search for: Johansen, H.
    New search for: Kaestner, G.
    New search for: Reichling, M.
    New search for: Matthias, E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Laser damage of alkaline-earth fluorides at 248 nm and the influence of polishing grades

    New search for: Stenzel, E.
    New search for: Gogoll, S.
    New search for: Sils, J.
    New search for: Huisinga, M.
    New search for: Johansen, H.
    New search for: Kaestner, G.
    New search for: Reichling, M.
    New search for: Matthias, E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Laser damage of alkaline-earth fluorides at 248 nm and the influence of polishing grades

    Contributors:

    Stenzel, E. (author) / Gogoll, S. (author) / Sils, J. (author) / Huisinga, M. (author) / Johansen, H. (author) / Kaestner, G. (author) / Reichling, M. (author) / Matthias, E. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 109/110 ; 162-167

    Publication date:

    1997-01-01

    Size:

    6 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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