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    Positron deep level transient spectroscopy - a new application of positron annihilation to semiconductor physics

    New search for: Beling, C. D.
    New search for: Fung, S.
    New search for: Au, H. L.
    New search for: Ling, C. C.
    New search for: Reddy, C. V.
    New search for: Deng, A. H.
    New search for: Panda, B. K.

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    Positron deep level transient spectroscopy - a new application of positron annihilation to semiconductor physics

    New search for: Beling, C. D.
    New search for: Fung, S.
    New search for: Au, H. L.
    New search for: Ling, C. C.
    New search for: Reddy, C. V.
    New search for: Deng, A. H.
    New search for: Panda, B. K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Positron deep level transient spectroscopy - a new application of positron annihilation to semiconductor physics

    New search for: Beling, C. D.
    New search for: Fung, S.
    New search for: Au, H. L.
    New search for: Ling, C. C.
    New search for: Reddy, C. V.
    New search for: Deng, A. H.
    New search for: Panda, B. K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Positron deep level transient spectroscopy - a new application of positron annihilation to semiconductor physics

    Contributors:

    Beling, C. D. (author) / Fung, S. (author) / Au, H. L. (author) / Ling, C. C. (author) / Reddy, C. V. (author) / Deng, A. H. (author) / Panda, B. K. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 116 ; 121-128

    Publication date:

    1997-01-01

    Size:

    8 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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