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Background-free Auger line shape of Ag N~2~,~3VV measured with positron annihilation induced Auger electron spectroscopy
Background-free Auger line shape of Ag N~2~,~3VV measured with positron annihilation induced Auger electron spectroscopy
Background-free Auger line shape of Ag N~2~,~3VV measured with positron annihilation induced Auger electron spectroscopy
Jung, E. (author) / Zhou, H. Q. (author) / Kim, J. H. (author) / Starnes, S. (author) / Venkataraman, R. (author) / Weiss, A. H. (author)
APPLIED SURFACE SCIENCE ; 116 ; 318-323
1997-01-01
6 pages
Article (Journal)
English
DDC:
621.35
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