Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Ion Implantation Induced Damage Accumulation Studied by Rutherford Backscattering Spectrometry and Spectroscopic Ellipsometry

    New search for: Lohner, T.
    New search for: Khanh, N. Q.
    New search for: Petrik, P.
    New search for: Fried, M.
    New search for: Kotai, E.
    New search for: Gyulai, J.
    New search for: Balogh, A. G.
    New search for: Walter, G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Ion Implantation Induced Damage Accumulation Studied by Rutherford Backscattering Spectrometry and Spectroscopic Ellipsometry

    New search for: Lohner, T.
    New search for: Khanh, N. Q.
    New search for: Petrik, P.
    New search for: Fried, M.
    New search for: Kotai, E.
    New search for: Gyulai, J.
    New search for: Balogh, A. G.
    New search for: Walter, G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Ion Implantation Induced Damage Accumulation Studied by Rutherford Backscattering Spectrometry and Spectroscopic Ellipsometry

    New search for: Lohner, T.
    New search for: Khanh, N. Q.
    New search for: Petrik, P.
    New search for: Fried, M.
    New search for: Kotai, E.
    New search for: Gyulai, J.
    New search for: Balogh, A. G.
    New search for: Walter, G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Ion Implantation Induced Damage Accumulation Studied by Rutherford Backscattering Spectrometry and Spectroscopic Ellipsometry

    Contributors:

    Lohner, T. (author) / Khanh, N. Q. (author) / Petrik, P. (author) / Fried, M. (author) / Kotai, E. (author) / Gyulai, J. (author) / Balogh, A. G. / Walter, G.

    Published in:

    Materials Science Applications of Ion Beam Techniques ; 229-232

    MATERIALS SCIENCE FORUM ; 248/249

    Publication date:

    1997-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Thin-Film Morphology and Rutherford Backscattering Spectrometry

    Hahn, T. / Metzner, H. / Gossla, M. et al. | British Library Online Contents | 1997

    Rutherford Backscattering Spectrometry and Nuclear Reaction Analysis

    Sie, S. H. | Springer Verlag | 1992

    NiTi thin film characterization by Rutherford backscattering spectrometry

    Goldberg, F. / Knystautas, E. J. | British Library Online Contents | 1996

    Preparation and characterization of Nd^3^+ and Er^3^+-doped silica sol-gel coatings by Rutherford backscattering spectroscopy and spectroscopic ellipsometry

    Bruynooghe, S. / Chabli, A. / Bertin, F. et al. | British Library Online Contents | 1997

    Ion channelling Rutherford backscattering spectrometry structural characterization of CdS/CdTe heterostructures

    Guerrieri, A. / Drigo, A. V. / Romanato, F. et al. | British Library Online Contents | 1993

    Back to top