Scanning tunneling microscopy and atomic force microscopy investigation of organic tetracyanoquinodimethane thin films: Fid-Bau Portal

Scanning tunneling microscopy and atomic force microscopy investigation of organic tetracyanoquinodimethane thin films

Gao, H. J. / Zhang, H. X. / Xue, Z. Q. / Pang, S. J.

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Scanning tunneling microscopy and atomic force microscopy investigation of organic tetracyanoquinodimethane thin films

Gao, H. J. / Zhang, H. X. / Xue, Z. Q. / Pang, S. J.

Scanning tunneling microscopy and atomic force microscopy investigation of organic tetracyanoquinodimethane thin films

Gao, H. J. / Zhang, H. X. / Xue, Z. Q. / Pang, S. J.

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Check availability in my library

Order at Subito €

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Document information

Title:

Scanning tunneling microscopy and atomic force microscopy investigation of organic tetracyanoquinodimethane thin films

Contributors:

Gao, H. J. (author) / Zhang, H. X. (author) / Xue, Z. Q. (author) / Pang, S. J. (author)

Published in:

JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 12 ; 1942-1945

Publication date:

1997-01-01

Size:

4 pages

ISSN:

0884-2914

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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