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    Microstructural study of treated grade 702 zirconium. Scanning electron microscopy and transmission electron microscopy, complementarity of two observational scales

    New search for: Crepin, J.
    New search for: Bretheau, T.
    New search for: Caldemaison, D.
    New search for: Barbu, A.
    New search for: Jazkierowitcz, G.

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    Microstructural study of treated grade 702 zirconium. Scanning electron microscopy and transmission electron microscopy, complementarity of two observational scales

    New search for: Crepin, J.
    New search for: Bretheau, T.
    New search for: Caldemaison, D.
    New search for: Barbu, A.
    New search for: Jazkierowitcz, G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Microstructural study of treated grade 702 zirconium. Scanning electron microscopy and transmission electron microscopy, complementarity of two observational scales

    New search for: Crepin, J.
    New search for: Bretheau, T.
    New search for: Caldemaison, D.
    New search for: Barbu, A.
    New search for: Jazkierowitcz, G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Microstructural study of treated grade 702 zirconium. Scanning electron microscopy and transmission electron microscopy, complementarity of two observational scales

    Contributors:

    Crepin, J. (author) / Bretheau, T. (author) / Caldemaison, D. (author) / Barbu, A. (author) / Jazkierowitcz, G. (author)

    Published in:

    JOURNAL OF MATERIALS SCIENCE ; 32 ; 4841-4846

    Publication date:

    1997-01-01

    Size:

    6 pages

    ISSN:

    0022-2461

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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