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Analytical electron microscopy of planar faults in SrO-doped CaTiO~3

Ceh, M. / Gu, H. / Muellejans, H. / Recnik, A.

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Analytical electron microscopy of planar faults in SrO-doped CaTiO~3

Ceh, M. / Gu, H. / Muellejans, H. / Recnik, A.

Analytical electron microscopy of planar faults in SrO-doped CaTiO~3

Ceh, M. / Gu, H. / Muellejans, H. / Recnik, A.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Analytical electron microscopy of planar faults in SrO-doped CaTiO~3

Contributors:

Ceh, M. (author) / Gu, H. (author) / Muellejans, H. (author) / Recnik, A. (author)

Published in:

JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 12 ; 2438-2446

Publication date:

1997-01-01

Size:

9 pages

ISSN:

0884-2914

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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