Transmission Electron Microscopy Study of GaN on SiC on SIMOX Grown by Metalorganic Chemical Vapor Deposition: Fid-Bau Portal

Transmission Electron Microscopy Study of GaN on SiC on SIMOX Grown by Metalorganic Chemical Vapor Deposition

Zhou, W. L. / Pirouz, P. / Namavar, F. / Colter, P. C. / Yoganathan, M. / Leksono, M. W. / Pankove, J. I.

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Transmission Electron Microscopy Study of GaN on SiC on SIMOX Grown by Metalorganic Chemical Vapor Deposition

Zhou, W. L. / Pirouz, P. / Namavar, F. / Colter, P. C. / Yoganathan, M. / Leksono, M. W. / Pankove, J. I.

Transmission Electron Microscopy Study of GaN on SiC on SIMOX Grown by Metalorganic Chemical Vapor Deposition

Zhou, W. L. / Pirouz, P. / Namavar, F. / Colter, P. C. / Yoganathan, M. / Leksono, M. W. / Pankove, J. I.

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Document information

Title:

Transmission Electron Microscopy Study of GaN on SiC on SIMOX Grown by Metalorganic Chemical Vapor Deposition

Contributors:

Zhou, W. L. (author) / Pirouz, P. (author) / Namavar, F. (author) / Colter, P. C. (author) / Yoganathan, M. (author) / Leksono, M. W. (author) / Pankove, J. I. (author)

Published in:

MATERIALS SCIENCE FORUM ; 264/268 ; 1239-1242

Publication date:

1998-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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