Photoluminescence and Raman Scattering Characterization of GaN, InGaN and AlGaN Films Using a UV Excitation Raman-Photoluminescence Microscope: Fid-Bau Portal

Photoluminescence and Raman Scattering Characterization of GaN, InGaN and AlGaN Films Using a UV Excitation Raman-Photoluminescence Microscope

Feng, Z. C. / Schurman, M. / Tran, C. A. / Salagaj, T. / Karlicek, B. / Ferguson, I. / Stall, R. A. / Dyer, C. D. / Williams, K. P. J. / Pitt, G. D.

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Photoluminescence and Raman Scattering Characterization of GaN, InGaN and AlGaN Films Using a UV Excitation Raman-Photoluminescence Microscope

Feng, Z. C. / Schurman, M. / Tran, C. A. / Salagaj, T. / Karlicek, B. / Ferguson, I. / Stall, R. A. / Dyer, C. D. / Williams, K. P. J. / Pitt, G. D.

Photoluminescence and Raman Scattering Characterization of GaN, InGaN and AlGaN Films Using a UV Excitation Raman-Photoluminescence Microscope

Feng, Z. C. / Schurman, M. / Tran, C. A. / Salagaj, T. / Karlicek, B. / Ferguson, I. / Stall, R. A. / Dyer, C. D. / Williams, K. P. J. / Pitt, G. D.

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Title:

Photoluminescence and Raman Scattering Characterization of GaN, InGaN and AlGaN Films Using a UV Excitation Raman-Photoluminescence Microscope

Contributors:

Feng, Z. C. (author) / Schurman, M. (author) / Tran, C. A. (author) / Salagaj, T. (author) / Karlicek, B. (author) / Ferguson, I. (author) / Stall, R. A. (author) / Dyer, C. D. (author) / Williams, K. P. J. (author) / Pitt, G. D. (author)

Published in:

MATERIALS SCIENCE FORUM ; 264/268 ; 1359-1362

Publication date:

1998-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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