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    Comparison between as-grown and annealed quantum dots morphology

    New search for: Ferrer, J. C.
    New search for: Peiro, F.
    New search for: Cornet, A.
    New search for: Morante, J. R.
    New search for: Utzmeier, T.
    New search for: Armelles, G.
    New search for: Briones, F.
    New search for: Davies, G.
    New search for: Nazare, M. H.

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    Comparison between as-grown and annealed quantum dots morphology

    New search for: Ferrer, J. C.
    New search for: Peiro, F.
    New search for: Cornet, A.
    New search for: Morante, J. R.
    New search for: Utzmeier, T.
    New search for: Armelles, G.
    New search for: Briones, F.
    New search for: Davies, G.
    New search for: Nazare, M. H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Comparison between as-grown and annealed quantum dots morphology

    New search for: Ferrer, J. C.
    New search for: Peiro, F.
    New search for: Cornet, A.
    New search for: Morante, J. R.
    New search for: Utzmeier, T.
    New search for: Armelles, G.
    New search for: Briones, F.
    New search for: Davies, G.
    New search for: Nazare, M. H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Document information
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    Document information
    Title:

    Comparison between as-grown and annealed quantum dots morphology

    Contributors:

    Ferrer, J. C. (author) / Peiro, F. (author) / Cornet, A. (author) / Morante, J. R. (author) / Utzmeier, T. (author) / Armelles, G. (author) / Briones, F. (author) / Davies, G. / Nazare, M. H.

    Published in:

    Defects in Semiconductors ICDS-19 ; 1689-1694

    MATERIALS SCIENCE FORUM ; 258/263

    Publication date:

    1997-01-01

    Size:

    6 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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