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    Raman scattering measurements in neutron-irradiated silicon

    New search for: Coeck, M.
    New search for: Laermans, C.
    New search for: Provoost, R.
    New search for: Silverans, R. E.

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    Raman scattering measurements in neutron-irradiated silicon

    New search for: Coeck, M.
    New search for: Laermans, C.
    New search for: Provoost, R.
    New search for: Silverans, R. E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Raman scattering measurements in neutron-irradiated silicon

    New search for: Coeck, M.
    New search for: Laermans, C.
    New search for: Provoost, R.
    New search for: Silverans, R. E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Raman scattering measurements in neutron-irradiated silicon

    Contributors:

    Coeck, M. (author) / Laermans, C. (author) / Provoost, R. (author) / Silverans, R. E. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 258/263 ; 623-628

    Publication date:

    1997-01-01

    Size:

    6 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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