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Study of dislocations in NiAl through the use of in-situ straining in transmission electron microscopy
Study of dislocations in NiAl through the use of in-situ straining in transmission electron microscopy
Study of dislocations in NiAl through the use of in-situ straining in transmission electron microscopy
Ghosh, B. (author) / Crimp, M. A. (author) / Herman, H. / Pope, D. P. / Liu, C. T. / Whang, S. H. / Yamaguchi, M.
1997-01-01
8 pages
Article (Journal)
English
DDC:
620.11
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