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A platform for research: civil engineering, architecture and urbanism
X-Ray Diffraction Analysis of Simultaneous Changes in Stress and Dislocation Densities in Thin Films
X-Ray Diffraction Analysis of Simultaneous Changes in Stress and Dislocation Densities in Thin Films
X-Ray Diffraction Analysis of Simultaneous Changes in Stress and Dislocation Densities in Thin Films
Vermeulen, A. C. (author) / Delhez, R. (author) / De Keijser, T. H. (author) / Mittenmeijer, E. J. (author)
ADVANCES IN X RAY ANALYSIS ; 195-210
1997-01-01
16 pages
Article (Journal)
English
DDC:
539.7222
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