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    Force modulation atomic force microscopy: background, development and application to electrodeposited cerium oxide films

    New search for: Li, F.-B.
    New search for: Thompson, G. E.
    New search for: Newman, R. C.

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    Force modulation atomic force microscopy: background, development and application to electrodeposited cerium oxide films

    New search for: Li, F.-B.
    New search for: Thompson, G. E.
    New search for: Newman, R. C.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Force modulation atomic force microscopy: background, development and application to electrodeposited cerium oxide films

    New search for: Li, F.-B.
    New search for: Thompson, G. E.
    New search for: Newman, R. C.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Force modulation atomic force microscopy: background, development and application to electrodeposited cerium oxide films

    Contributors:

    Li, F.-B. (author) / Thompson, G. E. (author) / Newman, R. C. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 126 ; 21-33

    Publication date:

    1998-01-01

    Size:

    13 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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