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    Characterization of As Implanted Silicides by Frequency Noise Level Measurements

    New search for: Stojanovic, M.
    New search for: Milosavljevic, M.
    New search for: Jeynes, C.
    New search for: Uskokovic, D. P.
    New search for: Milonjic, S. K.
    New search for: Rakovic, D. I.

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    Characterization of As Implanted Silicides by Frequency Noise Level Measurements

    New search for: Stojanovic, M.
    New search for: Milosavljevic, M.
    New search for: Jeynes, C.
    New search for: Uskokovic, D. P.
    New search for: Milonjic, S. K.
    New search for: Rakovic, D. I.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterization of As Implanted Silicides by Frequency Noise Level Measurements

    New search for: Stojanovic, M.
    New search for: Milosavljevic, M.
    New search for: Jeynes, C.
    New search for: Uskokovic, D. P.
    New search for: Milonjic, S. K.
    New search for: Rakovic, D. I.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
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    Document information
    Title:

    Characterization of As Implanted Silicides by Frequency Noise Level Measurements

    Contributors:

    Stojanovic, M. (author) / Milosavljevic, M. (author) / Jeynes, C. (author) / Uskokovic, D. P. / Milonjic, S. K. / Rakovic, D. I.

    Published in:

    Advanced Materials and Processes: YUCOMAT II ; 153-156

    MATERIALS SCIENCE FORUM ; 282/283

    Publication date:

    1998-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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