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Examination of IBAD-aluminum-layers by electrochemical noise analysis

Burkert, A. / Heyn, A. / Goellner, J. / Garz, I. / Vera, E. / Wolf, G. K.

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Examination of IBAD-aluminum-layers by electrochemical noise analysis

Burkert, A. / Heyn, A. / Goellner, J. / Garz, I. / Vera, E. / Wolf, G. K.

Examination of IBAD-aluminum-layers by electrochemical noise analysis

Burkert, A. / Heyn, A. / Goellner, J. / Garz, I. / Vera, E. / Wolf, G. K.

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Check availability in my library

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Document information

Title:

Examination of IBAD-aluminum-layers by electrochemical noise analysis

Contributors:

Burkert, A. (author) / Heyn, A. (author) / Goellner, J. (author) / Garz, I. (author) / Vera, E. (author) / Wolf, G. K. (author)

Published in:

MATERIALWISSENSCHAFT UND WERKSTOFFTECHNIK ; 29 ; 496-505

Publication date:

1998-01-01

Size:

10 pages

ISSN:

0933-5137

Type of media:

Article (Journal)

Type of material:

Language:

German

Classification:

DDC: 620.11

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