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    Angle-resolved X-ray photoelectron spectroscopy of topmost surface for LaNiO~3 thin film grown on SrTiO~3 substrate by laser molecular beam epitaxy

    New search for: Chen, P.
    New search for: Xu, S. Y.
    New search for: Lin, J.
    New search for: Ong, C. K.
    New search for: Cui, D. F.

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    Angle-resolved X-ray photoelectron spectroscopy of topmost surface for LaNiO~3 thin film grown on SrTiO~3 substrate by laser molecular beam epitaxy

    New search for: Chen, P.
    New search for: Xu, S. Y.
    New search for: Lin, J.
    New search for: Ong, C. K.
    New search for: Cui, D. F.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Angle-resolved X-ray photoelectron spectroscopy of topmost surface for LaNiO~3 thin film grown on SrTiO~3 substrate by laser molecular beam epitaxy

    New search for: Chen, P.
    New search for: Xu, S. Y.
    New search for: Lin, J.
    New search for: Ong, C. K.
    New search for: Cui, D. F.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Angle-resolved X-ray photoelectron spectroscopy of topmost surface for LaNiO~3 thin film grown on SrTiO~3 substrate by laser molecular beam epitaxy

    Contributors:

    Chen, P. (author) / Xu, S. Y. (author) / Lin, J. (author) / Ong, C. K. (author) / Cui, D. F. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 137 ; 98-102

    Publication date:

    1999-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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