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    Characterization of Grain Boundaries of Al-doped Sintered -SiC by Both HRTEM and STEM

    New search for: Kaneko, K.
    New search for: Saitoh, T.
    New search for: Tsurekawa, S.

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    Characterization of Grain Boundaries of Al-doped Sintered -SiC by Both HRTEM and STEM

    New search for: Kaneko, K.
    New search for: Saitoh, T.
    New search for: Tsurekawa, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterization of Grain Boundaries of Al-doped Sintered -SiC by Both HRTEM and STEM

    New search for: Kaneko, K.
    New search for: Saitoh, T.
    New search for: Tsurekawa, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Characterization of Grain Boundaries of Al-doped Sintered -SiC by Both HRTEM and STEM

    Contributors:

    Kaneko, K. (author) / Saitoh, T. (author) / Tsurekawa, S. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 294/296 ; 269-272

    Publication date:

    1999-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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