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Ion beam analysis of pulsed laser deposited Ti:sapphire

Key, P. H. / Kral, J. / Schmidt, M. J. J.

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Ion beam analysis of pulsed laser deposited Ti:sapphire

Key, P. H. / Kral, J. / Schmidt, M. J. J.

Ion beam analysis of pulsed laser deposited Ti:sapphire

Key, P. H. / Kral, J. / Schmidt, M. J. J.

Access

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Ion beam analysis of pulsed laser deposited Ti:sapphire

Contributors:

Key, P. H. (author) / Kral, J. (author) / Schmidt, M. J. J. (author) / Boyd, I. W. / Perriere, J. / Stuke, M.

Published in:

Proceedings of Symposium G on Surface Processing: Laser, Lamp, Plasma of the 1998 E-MRS Spring Conference - Strasbourg, France, June 16-1998 ; 503-506

APPLIED SURFACE SCIENCE ; 138/139

Publication date:

1999-01-01

Size:

4 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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