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Determining Crack Depth and Measurement Errors Using Timeof-Flight Diffraction Techniques

Lin, Y. / Liou, T. / Tsai, W.-H.

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Determining Crack Depth and Measurement Errors Using Timeof-Flight Diffraction Techniques

Lin, Y. / Liou, T. / Tsai, W.-H.

Determining Crack Depth and Measurement Errors Using Timeof-Flight Diffraction Techniques

Lin, Y. / Liou, T. / Tsai, W.-H.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Determining Crack Depth and Measurement Errors Using Timeof-Flight Diffraction Techniques

Contributors:

Lin, Y. (author) / Liou, T. (author) / Tsai, W.-H. (author)

Published in:

ACI MATERIALS JOURNAL ; 96 ; 190-195

Publication date:

1999-01-01

Size:

6 pages

ISSN:

0889-325X

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.1360 / 620

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