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    Electron emission microscope for use in electron emission sites observations

    New search for: Kobayashi, S.
    New search for: Mizusawa, T.
    New search for: Shirai, K.
    New search for: Saito, Y.
    New search for: Ogiwara, N.
    New search for: Latham, R.V.

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    Electron emission microscope for use in electron emission sites observations

    New search for: Kobayashi, S.
    New search for: Mizusawa, T.
    New search for: Shirai, K.
    New search for: Saito, Y.
    New search for: Ogiwara, N.
    New search for: Latham, R.V.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Electron emission microscope for use in electron emission sites observations

    New search for: Kobayashi, S.
    New search for: Mizusawa, T.
    New search for: Shirai, K.
    New search for: Saito, Y.
    New search for: Ogiwara, N.
    New search for: Latham, R.V.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Electron emission microscope for use in electron emission sites observations

    Contributors:

    Kobayashi, S. (author) / Mizusawa, T. (author) / Shirai, K. (author) / Saito, Y. (author) / Ogiwara, N. (author) / Latham, R.V. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 146 ; 148-151

    Publication date:

    1999-01-01

    Size:

    4 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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