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Atomic level analysis of electron emitter surfaces by the scanning atom probe
Atomic level analysis of electron emitter surfaces by the scanning atom probe
Atomic level analysis of electron emitter surfaces by the scanning atom probe
Nishikawa, O. (author) / Maeda, K. (author) / Ohtani, Y. (author) / Watanabe, M. (author) / Tanaka, K. (author) / Sekine, T. (author) / Iwatsuki, M. (author) / Aoki, S. (author) / Itoh, J. (author) / Yamanaka, K. (author)
APPLIED SURFACE SCIENCE ; 146 ; 398-407
1999-01-01
10 pages
Article (Journal)
English
DDC:
621.35
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