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    Atomic force microscopy, lateral force microscopy, and transmission electron microscopy investigations and adhesion force measurements for elucidation of tungsten removal mechanisms

    New search for: Stein, D. J.
    New search for: Cecchi, J. L.
    New search for: Hetherington, D. L.

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    Atomic force microscopy, lateral force microscopy, and transmission electron microscopy investigations and adhesion force measurements for elucidation of tungsten removal mechanisms

    New search for: Stein, D. J.
    New search for: Cecchi, J. L.
    New search for: Hetherington, D. L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Atomic force microscopy, lateral force microscopy, and transmission electron microscopy investigations and adhesion force measurements for elucidation of tungsten removal mechanisms

    New search for: Stein, D. J.
    New search for: Cecchi, J. L.
    New search for: Hetherington, D. L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Atomic force microscopy, lateral force microscopy, and transmission electron microscopy investigations and adhesion force measurements for elucidation of tungsten removal mechanisms

    Contributors:

    Stein, D. J. (author) / Cecchi, J. L. (author) / Hetherington, D. L. (author)

    Published in:

    JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 14 ; 3695-3706

    Publication date:

    1999-01-01

    Size:

    12 pages

    ISSN:

    0884-2914

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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