X-Ray Diffraction Characterization of Thermally Annealed Nanometric Alumina Powder: Fid-Bau Portal

X-Ray Diffraction Characterization of Thermally Annealed Nanometric Alumina Powder

Kimmel, G. / Dayan, D. / Zabicky, J.

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X-Ray Diffraction Characterization of Thermally Annealed Nanometric Alumina Powder

Kimmel, G. / Dayan, D. / Zabicky, J.

X-Ray Diffraction Characterization of Thermally Annealed Nanometric Alumina Powder

Kimmel, G. / Dayan, D. / Zabicky, J.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

X-Ray Diffraction Characterization of Thermally Annealed Nanometric Alumina Powder

Contributors:

Kimmel, G. (author) / Dayan, D. (author) / Zabicky, J. (author)

Published in:

MATERIALS SCIENCE FORUM ; 321-324 ; 762-767

Publication date:

2000-01-01

Size:

6 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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