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Atomic resolved imaging of cleaved NiO(100) surfaces by NC-AFM
Atomic resolved imaging of cleaved NiO(100) surfaces by NC-AFM
Atomic resolved imaging of cleaved NiO(100) surfaces by NC-AFM
Hosoi, H. (author) / Sueoka, K. (author) / Hayakawa, K. (author) / Mukasa, K. (author)
APPLIED SURFACE SCIENCE ; 157 ; 218-221
2000-01-01
4 pages
Article (Journal)
English
DDC:
621.35
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