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    Raman characterization of ion beam etched Hg1-xCdxTe surface

    New search for: Lu, H.
    New search for: Fang, J.

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    Raman characterization of ion beam etched Hg1-xCdxTe surface

    New search for: Lu, H.
    New search for: Fang, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Raman characterization of ion beam etched Hg1-xCdxTe surface

    New search for: Lu, H.
    New search for: Fang, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Raman characterization of ion beam etched Hg1-xCdxTe surface

    Contributors:

    Lu, H. (author) / Fang, J. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 75 ; 187 - 189

    Publication date:

    2000-01-01

    Size:

    3 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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