Surface photovoltage measurements for Cu, Ti and W determination in Si wafers

Cali, D. / Camalleri, C. M. / Raineri, V. | British Library Online Contents | 2001

Slow Decline of Photovoltage After Illumination

Konishi, T. / Tsujikawa, S. / Electrochemical Society; Corrosion Division et al. | British Library Conference Proceedings | 1998

Evaluations of the intrinsic stress value in silicon wafers from photovoltage measurements

Patrin, A. | British Library Online Contents | 2000

Diagnostics of Semiconductor Surface by Laser-Induced Photovoltage

Pohoryles, B. / Morawski, A. | British Library Online Contents | 1995

Conditioning of Si-interfaces by wet-chemical oxidation: Electronic interface properties study by surface photovoltage measurements

Angermann, H. | British Library Online Contents | 2014