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    X-ray photoelectron spectroscopy and auger electron spectroscopy studies of Al-doped ZnO films

    New search for: Chen, M.
    New search for: Wang, X.
    New search for: Yu, Y. H.
    New search for: Pei, Z. L.
    New search for: Bai, X. D.
    New search for: Sun, C.
    New search for: Huang, R. F.
    New search for: Wen, L. S.

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    X-ray photoelectron spectroscopy and auger electron spectroscopy studies of Al-doped ZnO films

    New search for: Chen, M.
    New search for: Wang, X.
    New search for: Yu, Y. H.
    New search for: Pei, Z. L.
    New search for: Bai, X. D.
    New search for: Sun, C.
    New search for: Huang, R. F.
    New search for: Wen, L. S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    X-ray photoelectron spectroscopy and auger electron spectroscopy studies of Al-doped ZnO films

    New search for: Chen, M.
    New search for: Wang, X.
    New search for: Yu, Y. H.
    New search for: Pei, Z. L.
    New search for: Bai, X. D.
    New search for: Sun, C.
    New search for: Huang, R. F.
    New search for: Wen, L. S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    X-ray photoelectron spectroscopy and auger electron spectroscopy studies of Al-doped ZnO films

    Contributors:

    Chen, M. (author) / Wang, X. (author) / Yu, Y. H. (author) / Pei, Z. L. (author) / Bai, X. D. (author) / Sun, C. (author) / Huang, R. F. (author) / Wen, L. S. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 158 ; 134-140

    Publication date:

    2000-01-01

    Size:

    7 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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