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Yield stress after double strain-path change

Vieira, M. F. / Fernandes, J. V. / Chaparro, B.

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Yield stress after double strain-path change

Vieira, M. F. / Fernandes, J. V. / Chaparro, B.

Yield stress after double strain-path change

Vieira, M. F. / Fernandes, J. V. / Chaparro, B.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Yield stress after double strain-path change

Contributors:

Vieira, M. F. (author) / Fernandes, J. V. (author) / Chaparro, B. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- A ; 284 ; 64 - 69

Publication date:

2000-01-01

Size:

6 pages

ISSN:

0921-5093

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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