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    Scanning force microscope study of detachment of nanometer adhering particulates

    New search for: Dickinson, J. T.
    New search for: Hariadi, R. F.
    New search for: Scudiero, L.
    New search for: Langford, S. C.

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    Scanning force microscope study of detachment of nanometer adhering particulates

    New search for: Dickinson, J. T.
    New search for: Hariadi, R. F.
    New search for: Scudiero, L.
    New search for: Langford, S. C.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Scanning force microscope study of detachment of nanometer adhering particulates

    New search for: Dickinson, J. T.
    New search for: Hariadi, R. F.
    New search for: Scudiero, L.
    New search for: Langford, S. C.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Scanning force microscope study of detachment of nanometer adhering particulates

    Contributors:

    Dickinson, J. T. (author) / Hariadi, R. F. (author) / Scudiero, L. (author) / Langford, S. C. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- A ; 288 ; 182 - 186

    Publication date:

    2000-01-01

    Size:

    5 pages

    ISSN:

    0921-5093

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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