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X-Ray Diffraction Characterization of Thin Superconductive Films

Kozaczek, K. J. / Book, G. W. / Watkins, T. R. / Carter, W. B.

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X-Ray Diffraction Characterization of Thin Superconductive Films

Kozaczek, K. J. / Book, G. W. / Watkins, T. R. / Carter, W. B.

X-Ray Diffraction Characterization of Thin Superconductive Films

Kozaczek, K. J. / Book, G. W. / Watkins, T. R. / Carter, W. B.

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Check availability in my library

Order at Subito €

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Document information

Title:

X-Ray Diffraction Characterization of Thin Superconductive Films

Contributors:

Kozaczek, K. J. (author) / Book, G. W. (author) / Watkins, T. R. (author) / Carter, W. B. (author)

Published in:

MATERIALS SCIENCE FORUM ; 203-210

Publication date:

1996-01-01

Size:

8 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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