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    Characterisation of the BaTiO3/p-Si interface and applications

    New search for: Evangelou, E. K.
    New search for: Konofaos, N.
    New search for: Craven, M. R.
    New search for: Cranton, W. M.
    New search for: Thomas, C. B.

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    Characterisation of the BaTiO3/p-Si interface and applications

    New search for: Evangelou, E. K.
    New search for: Konofaos, N.
    New search for: Craven, M. R.
    New search for: Cranton, W. M.
    New search for: Thomas, C. B.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterisation of the BaTiO3/p-Si interface and applications

    New search for: Evangelou, E. K.
    New search for: Konofaos, N.
    New search for: Craven, M. R.
    New search for: Cranton, W. M.
    New search for: Thomas, C. B.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Characterisation of the BaTiO3/p-Si interface and applications

    Contributors:

    Evangelou, E. K. (author) / Konofaos, N. (author) / Craven, M. R. (author) / Cranton, W. M. (author) / Thomas, C. B. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 166 ; 504-507

    Publication date:

    2000-01-01

    Size:

    4 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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